AMIDA ATI 600 測試機

AMIDA ATI 600 測試機

AMIDA ATI 600 Tester為半導體元件( MOSFET、BJT、DIODE,… 等)專用測試系統,透過填表與可編輯的程式控制,精準與快速測得產品的參數。在實際應用上,無論CP 或 FT 量產測試,或是元件特性的研究工程,AMIDA ATI 600 Tester實為使用者最佳的選擇。
技術特色
  • Easy operation & quick maintain
  • Low cost, low pin counts
  • High Throughput
  • High Reliability
  • High current, high voltage
  • Isolation ground system
  • Quick diagnosis & Auto-Calibration
  • Auto-temp control while heavy load
  • Quad site parallel testing capability
  • Table-wise software
  • Test MOSFET, LDO, OP-Amp, PWM, AC/DC, Hall Sensor, JFET, Transistor, Diode, Zener, SCR, Triac, TVS,…etc

 

DSC_ AP Module: 1000V / 20A
  • 2 High current VI source. (H-VI)
  • 1 Low current VI source. (M-VI)
  • 1 DVM channel
  • 1 High voltage VI source. (K-VI)
  • 6 A/D converters ( H-VI1_V, HVI1_I, HVI2_V, HVI2_I + MVI + DVM / KVI ) can read each channel simultaneously. ( pulse sync. In HVI, DVM )
  • Basic accuracy: ±0.05% of reading for each VI source channel.
  • Double side clamping.
  • On board 1 AWG ( 4K ) and 2 Digitizer. ( 2K each ), AWG & DIG sync. Operation.
  • 27 channels of 5V /12V relay control with 300mA driving capability each.
  • 5 MOSFET relay drivers with + 15V / 0V ( Hi / Lo ).
  • Automatic module ID identification. ( Read the resistor )
  • 5V/2A + 12V/1A, ±15V DUT power supply.

 

LDO_ AP Module : 30V / 10A
  • 2 High current VI source. (H-VI)
  • 1 Low current VI source. (M-VI)
  • 1 DVM channel
  • 1 TMU channel.
  • 6 A/D converters ( 2H-VI + 3M-VI + 1 DVM ) can read each channel simultaneously.
  • Basic accuracy: ±0.05% of reading for each VI source channel.
  • 32 channels of 5V /12V relay control with 300mA driving capability each.
  • Automatic module ID identification. ( Read the resistor )
  • 5V/2A + 12V/1A, ±15V DUT power supply.
  • USB 2.0 interface + on board catch memory.