The AMIDA 2020XP CIS tester is the latest generation of CMOS image sensing dedicated measurement instrument from AMIDA Technology. In addition to the original real and accurate measurement, it is a high-throughput mass production solution designed for high-throughput inspection of image lens modules and camera lenses. After nearly 20 years of mass production experience, it has been well-received by domestic and foreign first-class manufacturers. The AMIDA 2020XP CIS testing machine not only meets the customer's testing time and high output and accuracy requirements. Within the scope of functional flexibility, users can customize their own measurement requirements according to the definition of various sensors. AMIDA 2020XP CIS tester is a new generation of CMOS Image Sensor dedicated tester, which integrates DC Open/short/leakage test, AC Pattern test and image test. It uses 180 Pin high-speed cable to connect to the test terminal. The detailed specifications are as follows:
AMIDA VCSEL Tester can be divided into three parts, such as LIV measurement system, Near field measurement system and Far field measurement system. To achieve the above three measurements, in addition to the necessary optical components and optical instruments, the core technology is to provide fast and stable current pulses to drive the VCSEL laser diode to emit light, and then to test the characteristics of light and electricity. AMIDA has the ability to develop a fast and stable current pulse source, with the following levels: ♦ LDPMU : 100uS Pulse width @ 20A ♦ High Speed Pulser- 2PD : 10uS Pulse width @1A ♦ TOF Module : 100nS Pulse width@ 10A