The AMIDA
– 3000 Series provides more than twice times the number of analog channels for each test system's modules, resulting in a significant reduction in the acquisition cost per
channel, resulting in an increase in the number of analog channels across the test system by more than one more. This allows the system to have a higher number of parallel tests and competency levels, and also makes the IC unit testing cost of this tester
lower and more efficient. This series of test systems provides a combination of powerful test requirements for high-speed hardware and software integration capabilities.
AMIDA-3001XP tester built-in real-time protocol detection function, in addition to simplifying the
complexity and difficulty of test development, but also to use its high-speed computing power to significantly shorten the test time.
(1) Analog Devices:
(2) Mixed Signal / Digital / RF Devices: