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  AMIDA ATI 600 測試機 HOME / 產品資訊 / 類比暨混合訊號測試解決方案 / AMIDA ATI 600 測試機

AMIDA ATI 600 Tester為半導體元件( MOSFET、BJT、DIODE,… 等)專用測試系統，透過填表與可編輯的程式控制，精準與快速測得產品的參數。在實際應用上，無論CP 或 FT 量產測試，或是元件特性的研究工程，AMIDA ATI 600 Tester實為使用者最佳的選擇。
技術特色

  • • Easy operation & quick maintain

    • Low cost, low pin counts

    • High Throughput

    • High Reliability

    • High current, high voltage

    • Isolation ground system

    • Quick diagnosis & Auto-Calibration

    • Auto-temp control while heavy load

    • Quad site parallel testing capability

    • Table-wise software

    • Test MOSFET, LDO, OP-Amp, PWM, AC/DC, Hall Sensor, JFET, Transistor, Diode, Zener, SCR, Triac, TVS,…etc
DSC_ AP Module: 1000V / 20A

  • • 2 High current VI source. (H-VI)

    • 1 Low current VI source. (M-VI)

    • 1 DVM channel

    • 1 High voltage VI source. (K-VI)

    • 6 A/D converters ( H-VI1_V, HVI1_I, HVI2_V, HVI2_I + MVI + DVM / KVI ) can read each channel simultaneously. ( pulse sync. In HVI, DVM )

    • Basic accuracy: ±0.05% of reading for each VI source channel.

    • Double side clamping.

    • On board 1 AWG ( 4K ) and 2 Digitizer. ( 2K each ), AWG & DIG sync. Operation.

    • 27 channels of 5V /12V relay control with 300mA driving capability each.

    • 5 MOSFET relay drivers with + 15V / 0V ( Hi / Lo ).

    • Automatic module ID identification. ( Read the resistor )

    • 5V/2A + 12V/1A, ±15V DUT power supply.
LDO_ AP Module : 30V / 10A

  • • 2 High current VI source. (H-VI)

    • 3 Low current VI source. (M-VI)

    • 1 DVM channel.

    • 1 TMU channel.

    • 6 A/D converters ( 2H-VI + 3M-VI + 1 DVM ) can read each channel simultaneously.

    • Basic accuracy: ±0.05% of reading for each VI source channel.

    • 32 channels of 5V /12V relay control with 300mA driving capability each.

    • Automatic module ID identification. ( Read the resistor )

    • 5V/2A + 12V/1A, ±15V DUT power supply.

    • USB 2.0 interface + on board catch memory.