The aim of AMIDA-888
DC Characteristic Test System
is focus on RF high accuracy
test and measurement. It
is designed and built by
AMIDA Technology and developed
primarily to address high
volume test requirements
at minimal cost. Whatever
chip wafer map or final
test, AMIDA-888 presents
it really cost ownership
and high reliable. Testing
packaged RF components,
ICs and modules requires
not only a different skill
set than testing standard
mixed signal devices, but
different methodologies
and the skills to put them
all together. AMIDA-888
provides the user with shorter
test development cycles
allowing a faster response
to customer requests. This
high reliability, low cost
AMIDA-888 Test System is
designed for high performance
RF devices and suit for
mass production quality
control.
¡@Features
Flexible module combinations
offer various testing requirements.
Programmable
voltage and current range with
various modules - SMU, QVI,
OVI and HPU
Data
Acquisition 2ch, 4ch and 8ch
offers various digital measurement
requirements
With
50MS/s waveform update, up to
4M bytes of waveform memory,
AWG can use the accompanying
waveform editor to create and
generator many versatile waveforms.
High-end
TIA performances variety of
counter task, including even
counting, period measurement,
pulse width measurement and
frequency measurement.
DUT
Pin Matrix for 64 relay, maximum
to 2A
GPIB
- Compatible with IEEE 488.1
& 488.2 Standards
Powerful
Controller with multi resources
Customized
S/W
GUI
S/W Programming & C-language
Based System Software
